Scanning Electron Microscopy (SEM)

Facility/equipment: Equipment

    Equipments Details

    Description

    Our Zeiss SUPRA 55-VP microscope uses a field emission electron gun (FEG) which is the brightest type of electron source, giving high beam current and resolution capability.

    The SUPRA can be used to study a wide range of samples, from conducting and semiconducting materials, to large beam-sensitive or non-conducting samples. Non-conductive samples are with a thin layer of gold or carbon to prevent the build-up of charge on the sample surface during imaging.

    The microscope has a resolution of up to 1 nm and has a range of detectors including secondary electron, backscatter, and in-lens modes.

    The system is also equipped with an Oxford Instruments energy-dispersive X-ray (EDX) spectrometer, allowing for elemental analysis with a detection limit of roughly 0.5 at%.

    Details

    NameZEISS SUPRA 55-VP

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